High resolution transmission electron microscopy study in VC-doped WC–Co compound
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Open Access
- 1 January 2000
- journal article
- Published by Taylor & Francis in Science and Technology of Advanced Materials
- Vol. 1 (2) , 97-104
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Transmission Electron Microscopy1996
- Fine Grained WC–VC–Co HardmetalPowder Metallurgy, 1996