Characterization of structural dynamics ofthin film onusing in-air time-resolved x-ray diffraction
Authors:
- Masaki HadaMHMasaki Hada
- Kunio OkimuraKOKunio Okimura
- Jiro MatsuoJMJiro Matsuo
- 5 October 2010
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 82 (15)
Abstract
The lattice motion and displacement of atoms in the unit cell in vanadium dioxide (VO2) grown on c-Al2O3 were characterized by static and time-resolved x-ray diffraction (XRD) measurements. The monoclinic-tetragonal phase transition of the VO2 unit cell and the twist motion of vanadium atoms in the unit cell were observed. The time-resolved XRD measurements were performed in air using a tabletop high-repetition femtosecond laser. The results obtained from the time-resolved XRD measurements suggested that the unit cell of the low-temperature monoclinic VO2 transformed into the high-temperature tetragonal phase extremely rapidly (within 25 ps); however, the atoms in the unit cell fluctuated or vibrated about the center of the tetragonal coordinates, which abated within $\sim${}100$\hskip0.3em${}ps. Thus, the time-resolved XRD measurements of the Bragg angle, intensity, and width of the diffraction lines simultaneously revealed the phase transition of VO2 and the atomic motion in the unit cell.Keywords
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