Direct observation of resonance scattering patterns in single silicon nanoparticles

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Abstract
We present the first direct observation of the scattering patterns of electric and magnetic dipole resonances excited in a single silicon nanosphere. Almost perfectly spherical silicon nanoparticles were fabricated and deposited on a 30 nm-thick silicon nitride membrane in an attempt to minimize particle—substrate interaction. Measurements were carried out at visible wavelengths by means of the Fourier microscopy in a dark-field illumination setup. The obtained back-focal plane images clearly reveal the characteristic scattering patterns associated with each resonance and are found to be in a good agreement with the simulated results.
Funding Information
  • Science and Engineering Research Council (Pharos Program Grant No. 152 73 00025)

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