High-resolution Si 2p core-level photoemission spectroscopy on Sb-terminated Si(100) surfaces: evidence for a strong interfacial component
Authors:
- A CricentiACA Cricenti
- P PerfettiPPP Perfetti
- G Le LayGLG Le Lay
- 1 April 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 401 (3) , 427-433
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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