The diffraction pattern of projected structures

Author:
  • VEV. Elser
    V. Elser
Publisher website
Google Scholar
Abstract
A method for calculating the properties of structures obtained by projection is developed and applied to a three-dimensional generalization of the Penrose tiling. The diffraction pattern is shown in general to consist of a dense set of delta-function peaks. For the Penrose model the pattern in addition has the symmetry of the icosahedron.