Scanning nonlinear dielectric microscopy with nanometer resolution

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Abstract
A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c–c domain wall of a BaTiO3 single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.