Two-Directional Focusing of Charged Particles with a Sector-Shaped, Uniform Magnetic Field

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Abstract
For a sector-shaped, uniform magnetic field with source and detector outside the field, the non-uniform fringing fields can be employed to give simultaneous focusing of charged particles in two perpendicular directions. Equations for determining the position of the doubly-focused image are developed and graphs are given for some representative arrangements. This double focusing can be combined with the methods recently developed for second-order focusing, to increase further the useful solid angle of a uniform-field mass or momentum analyzer. Fringing-field focusing can also be used in concentrating to a point a parallel beam of finite cross section.

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