High-resolution synchrotron-radiation photoemission characterization for atomically-controlled SrTiO3(001) substrate surfaces subjected to various surface treatments
- 2 December 2004
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 96 (12) , 7183-7188
Abstract
The chemical properties and electronic structures of atomically flat substrates with various surface treatments have been investigated by high-resolution synchrotron-radiation photoemission spectroscopy. We have found that an annealing process causes the segregation of Sr oxides at the -terminated surface and that the -terminated surface is more stable than the SrO terminated one. We demonstrate that the use of chemical etching process is effective as a removal technique for Sr oxides accumulating on -terminated surfaces and that the adding of a reetching process after annealing in an environment is one of the best methods to obtain well defined and nearly perfect substrate surface.
Keywords
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