Rapid thermal annealing effect of transparent ITO source and drain electrode for transparent thin film transistors
Authors:
- Jin-Hyeok ParkJPJin-Hyeok Park
- Hae-Jun SeokHSHae-Jun Seok
- Sung Hyeon JungSJSung Hyeon Jung
- Hyung Koun ChoHyung Koun Cho
- Han-Ki KimHKHan-Ki Kim
- 1 February 2021
- journal article
- research article
- Published by Elsevier in Ceramics International
- Vol. 47 (3) , 3149-3158
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Trade, Industry and Energy
- Korea Electric Power Corporation
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