Provenance studies of New Zealand obsidian artefacts
Authors:
- 1 April 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 3 (1-3) , 419-423
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Thick target pixe analysis and yield curve calculationsNuclear Instruments and Methods, 1981
- PIXE-PIGME studies of artefactsNuclear Instruments and Methods, 1980
- Elemental analysis of thick obsidian samples by proton induced x-ray emission spectrometryAnalytical Chemistry, 1979