X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS
Authors:
- H AdeHAH Ade
- A.P SmithASA.P Smith
- H ZhangHZH Zhang
- G.R ZhuangGZG.R Zhuang
- J KirzJKJ Kirz
- E RightorERE Rightor
- A HitchcockAHA Hitchcock
- 1 March 1997
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 84 (1-3) , 53-72
Abstract
No abstract availableKeywords
This publication has 39 references indexed in Scilit:
- Inner-Shell Excitation Spectroscopy of Polymer and Monomer Isomers of Dimethyl PhthalateThe Journal of Physical Chemistry B, 1997
- Quantitative orientational analysis of a polymeric material (Kevlar® fibers) with x-ray microspectroscopyApplied Physics Letters, 1996
- Industrial applications of X‐ray microscopySynchrotron Radiation News, 1996
- X1A: Second-generation undulator beamlines serving soft x-ray spectromicroscopy experiments at the NSLSReview of Scientific Instruments, 1996
- X-ray microscopy in polymer science: prospects of a ‘new’ imaging techniquePolymer, 1995
- Soft x-ray microscopy with coherent x rays (invited)Review of Scientific Instruments, 1992
- High-resolutionK-shell photoabsorption measurements of simple moleculesPhysical Review A, 1991
- X-ray spectromicroscopy with a zone plate generated microprobeApplied Physics Letters, 1990
- Orientation of arachidate chains in Langmuir-Blodgett monolayers on Si(111)Physical Review Letters, 1987
- PLANS FOR A SCANNING TRANSMISSION X‐RAY MICROSCOPE*Annals of the New York Academy of Sciences, 1980