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Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy
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Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy
Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy
Authors:
Arent J. Kievits
Arent J. Kievits
BD
B. H. Peter Duinkerken
B. H. Peter Duinkerken
Ryan Lane
Ryan Lane
CH
Cecilia de Heus
Cecilia de Heus
DH
Daan van Beijeren Bergen En Henegouwen
Daan van Beijeren Bergen En Henegouwen
TH
Tibbe Höppener
Tibbe Höppener
AW
Anouk H. G. Wolters
Anouk H. G. Wolters
Nalan Liv
Nalan Liv
Ben N. G. Giepmans
Ben N. G. Giepmans
Jacob P. Hoogenboom
Jacob P. Hoogenboom
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1 July 2024
journal article
research article
Published by
Walter de Gruyter GmbH
in
Methods in Microscopy
Vol. 1
(2)
,
177
DOI:
10.1515/mim-2024-2001
Abstract
Article Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy was published on September 20, 2024 in the journal Methods in Microscopy (volume 0, issue 0).
Keywords
FAST-EM ARRAY
ARRAY TOMOGRAPHY
ARTICLE CORRIGENDUM
MULTIBEAM VOLUME
VOLUME ELECTRON
ELECTRON MICROSCOPY
JOURNAL METHODS
MICROSCOPY ARTICLE
FAST-EM
TOMOGRAPHY
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