Study of 1/f noise in N-MOSFET's: Linear region

Authors:

THT.Y. Hsiang
T.Y. Hsiang

Publisher website

1 December 1985

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 32 (12) , 2797-2802
DOI:10.1109/t-ed.1985.22418

Abstract

No abstract available

Keywords

Cited by 83 articles