Direct Atomic‐Level Imaging of Zeolites: Oxygen, Sodium in Na‐LTA and Iron in Fe‐MFI
Open Access
- 16 June 2020
- journal article
- research article
- Published by Wiley in Angewandte Chemie International Edition
- Vol. 59 (44) , 19510-19517
Abstract
Zeolites are becoming more versatile in their chemical functions through rational design of their frameworks. Therefore, direct imaging of all atoms at the atomic scale, basic units (Si, Al, and O), heteroatoms in the framework, and extra‐framework cations, is needed. TEM provides local information at the atomic level, but the serious problem of electron‐beam damage needs to be overcome. Herein, all framework atoms, including oxygen and most of the extra‐framework Na cations, are successfully observed in one of the most electron‐beam‐sensitive and lowest framework density zeolites, Na‐LTA. Zeolite performance, for instance in catalysis, is highly dependent on the location of incorporated heteroatoms. Fe single atomic sites in the MFI framework have been imaged for the first time. The approach presented here, combining image analysis, electron diffraction, and DFT calculations, can provide essential structural keys for tuning catalytically active sites at the atomic level.Keywords
Funding Information
- National Natural Science Foundation of China (21850410448, 21835002)
- Max-Planck-Gesellschaft
- ShanghaiTech University (#EM02161943)
- City University of Hong Kong (9610369)
- Alexander von Humboldt-Stiftung
This publication has 40 references indexed in Scilit:
- On the behavior of Ag nanowires under high temperature: in situ characterization by aberration-corrected STEMJournal of Materials Chemistry, 2010
- Collecting 3D electron diffraction data by the rotation methodZeitschrift für Kristallographie, 2010
- Studying Atomic Structures by Aberration-Corrected Transmission Electron MicroscopyScience, 2008
- Towards automated diffraction tomography: Part I—Data acquisitionUltramicroscopy, 2007
- MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPEAnnual Review of Materials Research, 2005
- Spectroscopic Imaging of Single Atoms Within a Bulk SolidPhysical Review Letters, 2004
- Sub-ångstrom resolution using aberration corrected electron opticsNature, 2002
- Upper limits for the residual aberrations of a high-resolution aberration-corrected STEMUltramicroscopy, 2000
- Electron Diffraction Structure Solution of a Nanocrystalline Zeolite at Atomic ResolutionThe Journal of Physical Chemistry B, 1999
- Electron Microscopic Study of Intergrowth of MFI and MEL: Crystal Faults in B-MELThe Journal of Physical Chemistry B, 1997