Proposal for Photothermal Characterization of Boundaries Between Layer and Substrate
Authors:
- 1 January 1993
- journal article
- research article
- Published by Taylor & Francis in Research in Nondestructive Evaluation
- Vol. 5 (1) , 31-39
Abstract
The accurate measurement of frequency dependent photothermal phase angle curves allows the characterization of the boundary layer between substrate and coating. Regarding the measurable quantities phase extremum and the ratio of the abscissa for the zero crossing and the extremum we can classify the boundary type as a jump in material properties, as a delamination or as a diffusion zone between substrate and coating.Keywords
This publication has 5 references indexed in Scilit:
- Photoacoustic frequency-domain depth profiling of continuously inhomogeneous condensed phases: Theory and simulations for the inverse problemJournal of Applied Physics, 1991
- Accurate reflectance measurement of high performance laser mirrors using a photoacoustic techniqueApplied Optics, 1989
- Nondestructive Evaluation with Thermal Waves1989
- Thermal-wave depth profiling of inhomogeneous solidsSemiconductor Science and Technology, 1989
- Photoacoustic study of the photochemistry of adsorbed indigoid dyesApplied Optics, 1982