Beamlet deflection due to beamlet-beamlet interaction in a large-area multiaperture negative ion source for JT-60U
Authors:
- 1 February 2008
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 79 (2) , 02C114
Abstract
The JT-60U negative ion source has been designed to produce high current beams of 22A through grids of 1080 apertures (five segments with nine rows of 24 apertures). One of the key issues is to steer such a high current beam through the multiaperture grids in order to focus the overall beam envelope because the beamlet-beamlet interaction may deflect the outer beamlets outward due to unbalanced space charge repulsion. To clarify the beam deflection in the JT-60U negative ion source, the beamlet trajectory in a multiaperture ion source was calculated by a three-dimensional simulation code. The measured angles of the outmost beamlets were in agreement with the calculated results where space charge of the beamlets was taken into account. It is noticed that the deflection of the outermost beamlet due to the beamlet-beamlet interaction is saturated at 5.2mrad outward for beamlets more than ten.Keywords
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