Michelson Interferometer as a Remote Gauge
Author:
- R. A. PattenRPR. A. Patten
- 1 December 1971
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 10 (12) , 2717-2721
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- High Precision Path Difference MeasurementApplied Optics, 1970
- Thickness and Refractive Index Measurement of a Lamina with a Michelson Interferometer*Journal of the Optical Society of America, 1966
- A Method of Determining Concurrently the Thickness and Refractive Index of a Thin Film or LaminaJournal of the Optical Society of America, 1950