Testing from Partial Deterministic FSM Specifications
Authors:
- A. PetrenkoAPA. Petrenko
- N. YevtushenkoNYN. Yevtushenko
- 25 July 2005
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 54 (9) , 1154-1165
Abstract
This paper addresses the problem of test generation from partially specified deterministic finite state machines (FSMs) that may have indistinguishable states and, thus, are not necessarily reduced (minimized). The known methods for checking experiments that are based on state identification are not applicable to unreduced machines. We propose the so-called state-counting approach that is directly applicable to unreduced FSMs. The approach generalizes the idea of state identification in test generation methods for deterministic machines.Keywords
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