On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt–Si and its effect on the electrical properties
Authors:
- J.P.B. SilvaJSJ.P.B. Silva
- K.C. SekharKSK.C. Sekhar
- S.A.S. RodriguesSRS.A.S. Rodrigues
- M. PereiraMPM. Pereira
- A. ParisiniAPA. Parisini
- E. AlvesEAE. Alves
- N.P. BarradasNBN.P. Barradas
- M.J.M. GomesMGM.J.M. Gomes
- 1 August 2013
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 278, 136-141
Abstract
No abstract availableKeywords
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