Kinetic properties of p-Mg2Si x Sn1 − x solid solutions for x < 0.4
- 13 September 2009
- journal article
- Published by Pleiades Publishing Ltd in Physics of the Solid State
- Vol. 51 (9) , 1796-1799
Abstract
The results of a study of Mg2Si x Sn1 − x solid solutions (x = 0.25, 0.3, 0.35, 0.4) are reported. The measurements performed cover the Seebeck coefficient, electrical conductivity and the Hall coefficient over broad ranges of temperatures (80–700 K) and carrier concentrations (1018 to 6 × 1020 cm−3). These measurements were used to derive the band structure parameters (band gap, hole mobility, hole effective mass). The effective mass of holes was found to grow strongly with an increase in their concentration.Keywords
This publication has 2 references indexed in Scilit:
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- Kinetic properties of p-type Mg/sub 2/Ge/sub 0.4/Sn/sub 0.6/ solid solutions2005