Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry

Authors:

DTDaniel W. Thompson
Daniel W. Thompson
MDMichael J. DeVries
Michael J. DeVries
TTThomas E. Tiwald
Thomas E. Tiwald
JWJohn A. Woollam
John A. Woollam

Publisher website

1 February 1998

journal article
Published by Elsevier in Thin Solid Films

Vol. 313-314, 341-346
DOI:10.1016/s0040-6090(97)00843-2

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles
Thin Solid Films, 1998
Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems
Physical Review B, 1996