Semiconductor yield improvement: results and best practices
Authors:
- S.P. CunninghamSCS.P. Cunningham
- C.J. SpanosCSC.J. Spanos
- K. VorosKVK. Voros
- 1 May 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 8 (2) , 103-109
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- The use and evaluation of yield models in integrated circuit manufacturingIEEE Transactions on Semiconductor Manufacturing, 1990