A new generation of QHARS: discussion about the technical criteria for quantization
Authors:
- W PoirierWPW Poirier
- A BounouhABA Bounouh
- F PiquemalFPF Piquemal
- J P AndréJAJ P André
- 12 June 2004
- journal article
- Published by IOP Publishing in Metrologia
- Vol. 41 (4) , 285-294
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Revised technical guidelines for reliable dc measurements of the quantized Hall resistanceMetrologia, 2003
- Quantum resistance standards with double 2degIEEE Transactions on Instrumentation and Measurement, 2003
- Analysis of different measurement setups for a programmable josephson voltage standardIEEE Transactions on Instrumentation and Measurement, 2003
- R K /100 and RK/200 quantum Hall array resistance standardsJournal of Applied Physics, 2002
- Conductivity-peak broadening in the quantum Hall regimePhysical Review B, 1993
- Series and parallel connection of multiterminal quantum Hall-effect devicesJournal of Applied Physics, 1993
- Direct comparison of quantized hall resistancesIEEE Transactions on Instrumentation and Measurement, 1991
- Technical Guidelines for Reliable Measurements of the Quantized Hall ResistanceMetrologia, 1989
- A geometric explanation of the temperature dependence of the quantised Hall resistanceJournal of Physics C: Solid State Physics, 1988
- New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall ResistancePhysical Review Letters, 1980