Single crystals of REMn2Si2 (RE=Y, Tb, Dy, Ho) were grown from a high-temperature lead metal flux by slowly cooling the melt in an argon atmosphere. The REMn2Si2 crystals were obtained as thin plates with well-developed (001) faces, and the largest crystals have maximum dimensions of about 2.6×2.6×0.02 mm3. The as-grown REMn2Si2 crystals were used for chemical analyses, measurements of unit cell parameters and magnetic susceptibility at low temperatures. The results of magnetic susceptibility measurements of the crystals are discussed.