Test data compression
Authors:
- D. BurekDBD. Burek
- B. KoenemannBKB. Koenemann
- S. MitraSMS. Mitra
- J. PatelJPJ. Patel
- J. RajskiJRJ. Rajski
- J. WaicukauskiJWJ. Waicukauski
- 26 March 2003
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 20 (2) , 76-87