AFM study of repulsive van der Waals forces between Teflon AF™ thin film and silica or alumina
Authors:
- Wolfgang M. SigmundWSWolfgang M. Sigmund
- 1 May 2002
- journal article
- Published by Elsevier in Colloids and Surfaces A: Physicochemical and Engineering Aspects
- Vol. 204 (1-3) , 43-50
Abstract
No abstract availableKeywords
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