Inelastic effects in Auger electron spectroscopy
Authors:
- W.M. MularieWMW.M. Mularie
- T.W. RuschTRT.W. Rusch
- 28 February 1970
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 19 (2) , 469-474
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Thin reaction layers and the surface structure of silicon (111)Surface Science, 1969
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968
- Use of LEED Apparatus for the Detection and Identification of Surface ContaminantsJournal of Applied Physics, 1967