Ion yield enhancement at the organic/inorganic interface in SIMS analysis using Ar-GCIB
Authors:
- V. CristaudoVCV. Cristaudo
- C. PoleunisCPC. Poleunis
- P. LahaPLP. Laha
- P. EloyPEP. Eloy
- T. HauffmanTHT. Hauffman
- H. TerrynHTH. Terryn
- A. DelcorteADA. Delcorte
- 1 January 2021
- journal article
- research article
- Published by Elsevier in Applied Surface Science
- Vol. 536
Abstract
No abstract availableKeywords
Funding Information
- Fédération Wallonie-Bruxelles (18/23-090)
- Fonds De La Recherche Scientifique - FNRS
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