Separation and correlation of structural and magnetic roughness in a Ni thin film by polarized off-specular neutron reflectometry

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Abstract
Diffuse (off-specular) neutron and x-ray reflectometry has been used extensively for the determination of interface morphology in solids and liquids. For neutrons, a novel possibility is off-specular reflectometry with polarized neutrons to determine the morphology of a magnetic interface. There have been few such attempts due to the lower brilliance of neutron sources, though magnetic interaction of neutrons with atomic magnetic moments is much easier to comprehend and easily tractable theoretically. We have obtained a simple and physically meaningful expression, under the Born approximation, for analyzing polarized diffuse (off-specular) neutron reflectivity (PDNR) data. For the first time PDNR data from a Ni film have been analyzed and separate chemical and magnetic morphologies have been quantified. Also specular polarized neutron reflectivity measurements have been carried out to measure the magnetic moment density profile of the Ni film. The fit to PDNR data results in a longer correlation length for in-plane magnetic roughness than for chemical (structural) roughness. The magnetic interface is smoother than the chemical interface.

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