Thickness dependence of piezoelectric property of ultrathin BiFeO3 films
Authors:
- J.L. ZhaoJZJ.L. Zhao
- H.X. LuHLH.X. Lu
- J.R. SunJSJ.R. Sun
- B.G. ShenBSB.G. Shen
- 1 June 2012
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 407 (12) , 2258-2261
Abstract
No abstract availableFunding Information
- National Natural Science Foundation of China
- National Fundamental Research of China
- Knowledge Innovation Project of the Chinese Academy of Sciences
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