Nano-displacement measurement based on virtual pinhole confocal method
Authors:
- Long LiLLLong Li
- Cuifang KuangCKCuifang Kuang
- Yi XueYXYi Xue
- Xu LiuXLXu Liu
- 19 February 2013
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 24 (3)
Abstract
No abstract availableKeywords
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