Tips for scanning tunneling microscopy produced by electron-beam-induced deposition
Authors:
- B. HübnerBHB. Hübner
- H.W.P. KoopsHKH.W.P. Koops
- H. PagniaHPH. Pagnia
- N. SotnikNSN. Sotnik
- J. UrbanJUJ. Urban
- M. WeberMWM. Weber
- 1 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 1519-1525
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- New scanning tunneling microscopy tip for measuring surface topographyJournal of Vacuum Science & Technology A, 1990
- High-resolution electron-beam induced depositionJournal of Vacuum Science & Technology B, 1988
- New selective deposition technology by electron-beam induced surface reactionJournal of Vacuum Science & Technology B, 1986