Methodology for Simultaneous Noise and Impedance Matching in W-Band LNAs
Authors:
- 1 November 2006
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 15508781,p. 279-282
Abstract
This paper presents a step-by-step methodology for simultaneous noise and input impedance matching in CMOS and SiGe W-band LNAs. This technique yields either increased gain or reduced power dissipation. Additionally, techniques to determine the optimum layout for MOSFETs in mm-wave LNAs are discussed. Measurement results in 90nm CMOS show a 1-stage 1.8V, 78GHz LNA with 3.8dB gain and 16mW power dissipation, and a 1.8V, 2-stage 94GHz LNA with 4.8dB gain, and 30mW power dissipation. In all cases S11 and S22 are lower than -10 dBKeywords
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