Test time reduction of successive approximation register A/D converter by selective code measurement
Authors:
- S. GoyalSGS. Goyal
- A. ChatterjeeACA. Chatterjee
- M. AtiaMAM. Atia
- H. IglehartHIH. Iglehart
- Chung Yu ChenCCChung Yu Chen
- B. ShenoudaBSB. Shenouda
- N. KhouzamNKN. Khouzam
- H. HaggagHHH. Haggag
- 6 February 2006
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 218-225
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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