Imaging defects and junctions in single-walled carbon nanotubes by voltage-contrast scanning electron microscopy
Authors:
- Aravind VijayaraghavanAVAravind Vijayaraghavan
- Christoph W. MarquardtCMChristoph W. Marquardt
- Simone DehmSDSimone Dehm
- Frank HennrichFHFrank Hennrich
- Ralph KrupkeRKRalph Krupke
Abstract
No abstract availableKeywords
Funding Information
- Agilent Technologies
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