Size Determination of Nanoparticles Based on Tapping-Mode Atomic Force Microscopy Measurements
Authors:
- Derrick MottDMDerrick Mott
- Benjamin CottsBCBenjamin Cotts
- I-Im S. LimILI-Im S. Lim
- Jin LuoJLJin Luo
- Hye-Young ParkHPHye-Young Park
- Peter N. NjokiPNPeter N. Njoki
- Mark J. SchadtMSMark J. Schadt
- Chuan-Jian ZhongCZChuan-Jian Zhong
- 1 June 2008
- journal article
- Published by American Scientific Publishers in Journal of Scanning Probe Microscopy
- Vol. 3 (1) , 1-8