Tip-Modulation Scanned Gate Microscopy
- 27 June 2008
- journal article
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 8 (8) , 2161-2165
Abstract
We introduce a technique that improves the sensitivity and resolution and eliminates the nonlocal background of scanned gate microscopy (SGM). In conventional SGM, a voltage bias is applied to the atomic force microscope tip and the sample conductance is measured as the tip is scanned. In the new technique, which we call tip-modulation SGM (tmSGM), the biased tip is oscillated and the induced oscillation of the sample conductance is measured. Applied to single-walled carbon nanotube network devices, tmSGM gives sharp, low-noise and background-free images.Keywords
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