Aiding the operator during novel fault diagnosis
Authors:
- W.C. YoonWYW.C. Yoon
- J.M. HammerJHJ.M. Hammer
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Systems, Man, and Cybernetics
- Vol. 18 (1) , 142-148
Abstract
No abstract availableKeywords
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