Surface measurements on freshly cleaved silicon p-n junctions
Authors:
- G.W. GobeliGGG.W. Gobeli
- F.G. AllenFAF.G. Allen
- 1 July 1960
- journal article
- Published by Elsevier in Journal of Physics and Chemistry of Solids
- Vol. 14, 23-26
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Cleaning of Silicon Surfaces by Heating in High VacuumJournal of Applied Physics, 1959
- Work function and emission studies on clean silicon surfacesJournal of Physics and Chemistry of Solids, 1959
- Effects of environment on the fracture behavior of germaniumActa Metallurgica, 1958
- Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low-Energy Electron DiffractionJournal of Applied Physics, 1958