Interferometric phase microscopy using slightly-off-axis reflective point diffraction interferometer
Authors:
- Hongyi BaiHBHongyi Bai
- Zhi ZhongZZZhi Zhong
- Mingguang ShanMSMingguang Shan
- Lei LiuLLLei Liu
- Lili GuoLGLili Guo
- Yabin ZhangYZYabin Zhang
- 1 March 2017
- journal article
- Published by Elsevier in Optics and Lasers in Engineering
- Vol. 90, 155-160
Abstract
No abstract availableFunding Information
- National Natural Science Foundation of China (61377009)
- National Scientific Instrument and Equipment Development Project of China (2013YQ290489 and 2011YQ040136)
- China Scholarship (201506685053)
- Heilongjiang Science Foundation of China (F201411)
- Harbin Science Foundation of China (2014RFQXJ030)
- Fundamental Research Funds
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