Correction of systematic errors in the determination of X-ray diffraction intensities by integrating microdensitometers
Author:
- 1 May 1971
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 4 (5) , 351-353
Abstract
Correction of errors in measurement of X-ray diffraction intensities by integrating microdensitometers which arise from nonlinear characteristics response curves and a finite size of the cross section of the transmitted light beam is discussed.Keywords
This publication has 9 references indexed in Scilit:
- Studies on Flavin Derivatives. Crystal Structure of 5-Acetyl-9-bromo-1,3,7,8-tetramethyl-1,5-dihydroalloxazine.Acta Chemica Scandinavica, 1971
- The Crystal Structure of Mercury(I) Hexafluorosilicate Dihydrate.Acta Chemica Scandinavica, 1971
- Accuracy in film-scanner intensity measurementsActa Crystallographica Section A, 1970
- Hydrogen Bond Studies. 39. Reinvestigation of the Crystal Structure of Acetic Acid (at +5 degrees C and -190 degrees C).Acta Chemica Scandinavica, 1970
- The crystal structure of yugawaraliteActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969
- An automatic scanning densitometer and its application to x-ray crystallographyJournal of Physics E: Scientific Instruments, 1969
- A computer-linked cathode-ray tube microdensitometer for X-ray crystallographyJournal of Physics E: Scientific Instruments, 1968
- A computer controlled film scannerJournal of Scientific Instruments, 1966
- A second comparison of various commercially available X-ray filmsActa Crystallographica, 1963