70-GHz Effective Sampling Time-Base On-Chip Oscilloscope in CMOS
Authors:
- 23 July 2007
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 42 (8) , 1743-1757
Abstract
This paper examines a time-base measurement system for on-chip digitization. Undersampling, combined with single-path time-domain amplification and processing, is used to perform the embedded measurement in a time-efficient manner. The proposed system relies on simple circuit components while performing high-speed measurements. Additionally, ease of calibration with minimal silicon area overhead renders the system attractive from a design-for-test perspective. The circuit was implemented in a 0.18-mum standard digital CMOS process using a single 1.8-V supply. On-chip interconnect crosstalk generation with variable strength is included on chip for characterization, and successfully measured using the prototype chip. An effective 70-GHz sampling rate is experimentally obtained from the implemented on-chip oscilloscope, with a voltage resolution of 4 mV. The estimated static power dissipation is ~3.5 mW, with a total active area of 0.45 mm2 taken up by the associated test and calibration vehicles.Keywords
This publication has 10 references indexed in Scilit:
- A 1-ps Resolution On-Chip Sampling Oscilloscope with 64:1 Tunable Sampling Range Based on Ramp Waveform Division Scheme2006
- Process-insensitive modulated-clock voltage comparator2006
- A CMOS time amplifier for Femto-second resolution timing measurement2004
- On-chip oscilloscopes for noninvasive time-domain measurement of waveforms in digital integrated circuitsIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2003
- Time difference amplifierElectronics Letters, 2002
- A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuitsIEEE Journal of Solid-State Circuits, 2002
- The challenge of signal integrity in deep-submicrometer CMOS technologyProceedings of the IEEE, 2001
- A cooperative research for experimental characterization of signal integrity in deep submicron integrated circuits1999
- On-chip sampling in CMOS integrated circuitsIEEE Transactions on Electromagnetic Compatibility, 1999
- An integrated 16-channel CMOS time to digital converterIEEE Transactions on Nuclear Science, 1994