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Low Temperature Oxidation of Silicon Studied by Photosensitive ESR and Auger Electron Spectroscopy
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Low Temperature Oxidation of Silicon Studied by Photosensitive ESR and Auger Electron Spectroscopy
Low Temperature Oxidation of Silicon Studied by Photosensitive ESR and Auger Electron Spectroscopy
Authors:
JR
Jerzy Rużyłło
Jerzy Rużyłło
IS
Ikuo Shiota
Ikuo Shiota
NM
Nobuo Miyamoto
Nobuo Miyamoto
JN
Jun‐Ichi Nishizawa
Jun‐Ichi Nishizawa
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1 January 1976
journal article
Published by
The Electrochemical Society
in
Journal of the Electrochemical Society
Vol. 123
(1)
,
26-29
DOI:
10.1149/1.2132758
Abstract
No abstract available
Keywords
THERMAL OXIDATION
AUGER ELECTRON SPECTROSCOPY
OXIDATION PROCESS
ATMOSPHERIC TEMPERATURE RANGE
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Cited by 19 articles
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