Relationship between the correction factor of the four-point probe value and the selection of potential and current electrodes
Author:
- R RymaszewskiRRR Rymaszewski
- 1 February 1969
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 2 (2) , 170-174
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Empirical method of calibrating a 4-point microarray for measuring thin-film-sheet resistanceElectronics Letters, 1967
- Method for Hall Mobility and Resistivity Measurements on Thin LayersJournal of Applied Physics, 1964
- Measurement of Sheet Resistivities with the Four-Point ProbeBell System Technical Journal, 1958
- The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor EngineeringBell System Technical Journal, 1955