Analysis of I–V measurements on PtSi-Si Schottky structures in a wide temperature range
Authors:
- D. DonovalDDD. Donoval
- M. BarusMBM. Barus
- M. ZdimalMZM. Zdimal
- 1 December 1991
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 34 (12) , 1365-1373
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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