A Markov approach to wear-out modelling
Authors:
- Andrea BobbioABAndrea Bobbio
- Aldo CumaniACAldo Cumani
- 1 January 1983
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 23 (1) , 113-119
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- On the canonical representation of homogeneous markov processes modelling failure - time distributionsMicroelectronics Reliability, 1982
- Multi-state homogeneous Markov models in reliability analysisMicroelectronics Reliability, 1980
- An Optimal Inspection and Replacement PolicyIEEE Transactions on Reliability, 1975
- Optimal maintenance policy for systems that experience state degradationsMicroelectronics Reliability, 1975
- Shock Models and Wear ProcessesThe Annals of Probability, 1973
- Markov Approach to Finding Failure Times of Repairable SystemsIEEE Transactions on Reliability, 1970