A quantitative XPS study of spherically shaped powders coated with an overlayer
Authors:
- Enshan ShengESEnshan Sheng
- 1 August 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 314 (3) , 325-330
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Thickness determination of oxide layers on spherically‐shaped metal powders by ESCASurface and Interface Analysis, 1988
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979