Determination of optical properties in nanostructured thin films using the Swanepoel method
Authors:
- J. Sánchez-GonzálezJSJ. Sánchez-González
- A. Díaz-ParralejoADA. Díaz-Parralejo
- A.L. OrtizA.L. Ortiz
- F. GuiberteauFGF. Guiberteau
- 1 June 2006
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 252 (17) , 6013-6017
Abstract
No abstract availableKeywords
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