Lower Confidence Limits on Process Capability Indices
Authors:
- 1 July 1990
- journal article
- research article
- Published by Taylor & Francis in Journal of Quality Technology
- Vol. 22 (3) , 223-229
Abstract
Lower confidence limits are derived for the common measures of process capability, usually indicated by Cp, CPU, CPL, and Cpk. The measures are estimated based on a random sample of observations from the process when the process is assumed to be normally distributed and has reached a state of statistical control.Keywords
This publication has 4 references indexed in Scilit:
- Assessing Process Capability: A Bayesian ApproachIIE Transactions, 1989
- A New Measure of Process Capability:CpmJournal of Quality Technology, 1988
- Process Capability IndicesJournal of Quality Technology, 1986
- One-Sided Confidence Regions on the Upper and Lower Tail Areas of the Normal DistributionJournal of Quality Technology, 1984