Design of an Operational Amplifier Input Stage Immune to EMI
Author:
- 19 November 2007
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electromagnetic Compatibility
- Vol. 49 (4) , 834-839
Abstract
This paper presents a new analytical model to predict upsets, which are induced by electromagnetic interferences (EMI) in CMOS operational amplifiers (opamps). In particular, it is pointed out that the demodulation of EMI, which is experienced in feedback CMOS opamps, is related to the power spectral density of the interfering signals reaching the opamp input terminals. Furthermore, the new model is employed to design a differential stage immune to EMI.Keywords
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